芯片系统

How to perform the SOC test with reduction the development cycle time and production cost without scarifying the performance is the challenge confronted by design engineer and test engineer.

如何在缩短计周期、降低芯片本而又不损失芯片性能的提下SOC统芯片的测试是芯片计工程和测试工程所要面对的挑战。