The structure and working principle of the devices for melting point measurement by means of thin film comparative method of cryoscopy were introduced.
介绍凝固
下降薄层比较法测
标准物质的测装置的构
与工作原
。
The structure and working principle of the devices for melting point measurement by means of thin film comparative method of cryoscopy were introduced.
介绍凝固下降薄层比较法测标准物质的测装置的构与工作原。
声明：以上例句、词性分类均由互联网资源自
，部分未经过人工审核，其表达内容亦不代表本软件的观
；若发现问题，欢迎向我们指正。
