How to perform the SOC test with reduction the development cycle time and production cost without scarifying the performance is the challenge confronted by design engineer and test engineer.
如何在缩短
计周期、降低芯片成本而又不损失芯片性能的前提下完成SOC系统芯片的
芯片计工
工当前所要面对的挑战。
How to perform the SOC test with reduction the development cycle time and production cost without scarifying the performance is the challenge confronted by design engineer and test engineer.
如何在缩短计周期、降低芯片成本而又不损失芯片性能的前提下完成SOC系统芯片的芯片计工工当前所要面对的挑战。
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