How to perform the SOC test with reduction the development cycle time and production cost without scarifying the performance is the challenge confronted by design engineer and test engineer.
如何在缩短
期、降低芯片成本而又不损失芯片性能的前提下完成SOC系统芯片的测试是芯片工程师和测试工程师当前所要面对的挑战。
声明：以上例句、词性分类均由互
源自动生成，部分未经过人工审核，其表达内容亦不代表本软件的观点；若发现问题，欢迎向我们指正。
How to perform the SOC test with reduction the development cycle time and production cost without scarifying the performance is the challenge confronted by design engineer and test engineer.
如何在缩短计周期、降低
本而又不损失
能的前提下完SOC系统的测试是计工程师和测试工程师当前所要面对的挑战。
声明：以上例句、词
均由互联网资源自动生
，部未经过人工审核，其表达内容亦不代表本软件的观点；若发现问题，欢迎向我们指正。
How to perform the SOC test with reduction the development cycle time and production cost without scarifying the performance is the challenge confronted by design engineer and test engineer.
如何在缩
周期、降低芯片成本而又不损失芯片性能的前提下完成SOC系统芯片的测试是芯片工程师和测试工程师当前所要面对的挑战。
声明：以上例句、词性分类均由互联
自动生成，部分未经过人工审核，其表达内容亦不代表本软件的观点；若发现问题，欢迎向我们指正。
How to perform the SOC test with reduction the development cycle time and production cost without scarifying the performance is the challenge confronted by design engineer and test engineer.
如何在缩短计周期、降低成本而又不损
性能的前提下完成SOC系统的测试是计工程师和测试工程师当前所要面对的挑
。
：以上例句、词性分类均由互联网资源自动生成，部分未经过人工审核，其表达内容亦不代表本软件的观点；若发现问题，欢迎向我们指正。
How to perform the SOC test with reduction the development cycle time and production cost without scarifying the performance is the challenge confronted by design engineer and test engineer.
如何在缩短计周期、降低芯片成本而又不损失芯片性能的前提下完成SOC系统芯片的测试是芯片计工程师和测试工程师当前所要面对的挑战。
声明：以上
、词性类均由互联网资源自动生成，
经过人工审核，其表达内容亦不代表本软件的观点；若发现问题，欢迎向我们指正。
How to perform the SOC test with reduction the development cycle time and production cost without scarifying the performance is the challenge confronted by design engineer and test engineer.
如何在缩短计周期、降
成本而又不损失性能的前提下完成SOC系统的测试是计工程师和测试工程师当前所要面对的挑战。
声明：以上例句、词性
由互联网资源自动生成，部未经过人工审核，其表达内容亦不代表本软件的观点；若发现问题，欢迎向我们指正。
How to perform the SOC test with reduction the development cycle time and production cost without scarifying the performance is the challenge confronted by design engineer and test engineer.
如何在缩短计周期、降低芯成本而又不损失芯性能
前提下完成SOC系统芯
是芯计工程师
工程师当前所要面对挑战。
声明：以上例句、词性分类均由互联网资源自动生成，部分未经过人工审核，其表达内容亦不代表本软件
观点；若发现问题，欢迎向我们指正。
How to perform the SOC test with reduction the development cycle time and production cost without scarifying the performance is the challenge confronted by design engineer and test engineer.
如何在缩短计周期、降低片成本而又不损失片性能的前提下完成SOC
片的测试是片计
和测试当前所要面对的挑战。
声明：以上例句、词性分类均由互联网资源自动生成，部分未经过人
审核，其表达内容亦不代表本软件的观点；若发现问题，欢迎向我们指正。
How to perform the SOC test with reduction the development cycle time and production cost without scarifying the performance is the challenge confronted by design engineer and test engineer.
何在缩短计周期、降低芯片本而又不损失芯片性能的前提下完SOC系统芯片的测试是芯片计工程师和测试工程师当前所要面对的挑战。
声明：以上例、词性类均由互联网资源自动生，未经过人工审核，其表达内容亦不代表本软件的观点；若发现问题，欢迎向我们指正。